ACS_ The journal of physical chemistry c
February 18, 2021
Volume 125, Issue 6
Pages 3269-3650
Local Mapping of the Thickness-Dependent Dielectric Constant of MoS2
The dielectric constant (ε) is crucial in determining the opto-electrical properties of two-dimensional layered material-based devices. We perform a spatially resolved ε mapping to observe the local dielectric properties of the MoS2 film by using an electrostatic force microscopy technique, where ε shows a thickness-dependent behavior. View the article.
- Yebin Kang
- Dohyeon Jeon
Taekyeong Kim
https://pubs.acs.org/toc/jpccck/125/6
Image created by minjeong Kim / Nanosphere
ACS_ The journal of physical chemistry c
February 18, 2021
Volume 125, Issue 6
Pages 3269-3650
Local Mapping of the Thickness-Dependent Dielectric Constant of MoS2
The dielectric constant (ε) is crucial in determining the opto-electrical properties of two-dimensional layered material-based devices. We perform a spatially resolved ε mapping to observe the local dielectric properties of the MoS2 film by using an electrostatic force microscopy technique, where ε shows a thickness-dependent behavior. View the article.
Taekyeong Kim
https://pubs.acs.org/toc/jpccck/125/6
Image created by minjeong Kim / Nanosphere